Far infrared spectroscopy and imaging of Cu(In, Ga)Se2 layers

  • L. Minkevičius
  • S. Balakauskas
  • M. Šoliūnas
  • R. Suzanovičienė
  • J. Uzėla
  • G. Molis
  • R. Juškėnas
  • A. Selskis
  • G. Niaura
  • G. Valušis
  • V. Tamošiūnas

Anotacija

The Fourier transform infrared spectroscopy (FT-IR), terahertz time domain spectroscopy (THz-TDS), and terahertz imaging were applied to study the properties of Cu(In, Ga)Se2 (CIGS) layers grown on Mo/soda lime glass substrate. Correlation between the Infrared reflectivity spectrum around 5–7 THz (167–233 cm–1), Raman spectra, and X-ray diffraction data is investigated for samples grown on the molybdenum layer of approximately 1 μm in thickness. Also, transparency of CIGS layers was demonstrated for frequencies down to several hundred gigahertzes. Such transparency opens possibilities for future three-dimensional characterization of CIGS structures using phase sensitive imaging.
Publikuotas
2014-01-23
Skyrius
Condensed Matter Physics and Technology