Fluence dependent variations of barrier charging and generation currents in neutron and proton irradiated Si particle detectors

Abstract

The stability of the potential barrier is an essential characteristic in high energy particle detector operation under irradiation conditions. In this work a technique for barrier evaluation by linearly increasing voltage (BELIV) is presented, based on analysis of current transients measured at reverse biasing. The technique has been applied to diodes irradiated by neutrons and protons with fluences in the range of 1012–1016 cm–2 in 1 MeV neutron equivalent. Fluence and temperature dependent characteristics of the diode barrier capacitance as well as of generation current are discussed. Keywords: charge extraction currents, junction barrier, generation current, radiation defects